Committee
Loss Prevention 2019

International Scientific Committee

 

Chairman

Fabiano, University of Genova/IT

 

Guest members

F. Khan, Memorial University St John’s/CA
Z. Wu, China Academy of Safety Science and Technology/CN

 

Honorary member

H.J. Pasman, Texas A&M University/US

 

Members

F. Babinec, Brno University of Technology/CZ
A. Bernatik, Technical University of Ostrava/CZ
V. Cozzani, University of Bologna/IT
E. De Rademaeker, Prevention Management International/B
H. Gasche, Bayer/DE
P. Guterl, BG Raw Materials and Chemical Industry/DE
R. Harbers, Aspen Oss B.V./NL
A. Jacobsson, AJ Risk Engineering AB/SE
L. Jelemensky, Slovak University of Technology in Bratislava/SK
N. Jensen, Safepark Consultancy/DK
T. Kilpeläinen, UPM Biorefining/FI
R. Koivisto, VTT Research Centre of Finland/FI
A. Laurent, Université de Lorraine – CNRS – EN SIC/FR
N. Markatos, National Technical University of Athens/GR
A. Markowski, Technical University of Lodz/PL
T. Meyer, EPFL Swiss Federal Institute of Technology in Lausanne/CH
N. Paltrinieri, NTNU/NO
A. Pey, Stahl Holding bv./ES
G. Pilkington, APEX Process Safety Ltd./GB
Z.N. Pintaric, University of Maribor/SI
G.L.L. Reniers, University of Antwerp/B
L. Ruhlman, Yara/NO
M. Schwaninger, TÜV-Süd/CH
J. Sommer, BG RCI/DE
D. Tabouelle, Chevron/FR
P. Tuna, Lund University/SE
L. Vijgen, DCMR/NL
W. Zongzhi, Director General of the Department of Occupational Health Inspection, State Administration of Work Safety (SAWS)    

 

National Organizing Committee

S. Bader, RIVM
R. Bannink, Navigator Consult
P. Bareman, VNCI
G. Boogaerts, Essenscia
V. Cozzani, University of Bologna  
E. De Rademaeker, PMI International
B. Fabiano, University of Genova
P. Hoorelbeke, VUB & Total
N. Khakzad, Delft University of Technology F. Khan, Memorial University of Newfoundland T. Koerts, EPSC
A. Laurent, Université de Lorraine
J. Meissen, Royal Dutch Society of Engineers H. Pasman, Texas A&M University
G. Reniers, University of Antwerp & TUDelft   D. Roosendans, Total
A. Verboom, CGE Risk Management Solutions